850nm Proton VCSEL Reliability Study
Advanced Optical Components has a long history of providing highly reliable, superior quality products. We take four basic approaches to ensure high reliability of our products:
1. Our development program for new products includes extensive reliability simulation and analysis, such as thermal stress analysis and failure mode and effects analysis (FMEA).
2. The development program also includes exhaustive reliability testing, such as sensitivity to electrostatic discharge (ESD), mechanical and thermal tests, and accelerated life testing.
3. A sample from each wafer is subjected to reliability testing, including burn-in, before release of the wafer to production. Also, production processing includes environmental stress screening, typically burn-in, for products as necessary to ensure good reliability for devices shipped.
4. We continue to monitor product reliability and supplement our reliability database through our Product Reliability Monitor Program, which periodically subjects a large sample of production devices to a battery of reliability tests, including extended operating life testing.
This study summarizes the results of the extensive development reliability testing performed for the 850-nm Vertical Cavity Surface Emitting Laser (VCSEL) product. It is an update to the extensive reliability information published several times earlier, and demonstrates the reliability improvements made since that time.
850nm Proton VCSEL Reliability Study
